XPS insights: Sample degradation in X‐ray photoelectron spectroscopy
نویسندگان
چکیده
Standard X-ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non-destructive form analysis; however, both the interaction photons and subsequent electron cascade can cause significant changes to analysed area. This XPS Insights paper gives brief overview this phenomenon, supported specific examples experimental advice assess minimise damage during analysis.
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ژورنال
عنوان ژورنال: Surface and Interface Analysis
سال: 2023
ISSN: ['0142-2421', '1096-9918']
DOI: https://doi.org/10.1002/sia.7205